Summary of Atomic Force Microscopy (AFM) Workshop

00:00:00 - 00:45:00

The video discusses the use of atomic force microscopy (AFM) to examine various materials. AFM can be used to measure small volumes of material at very low forces, making it a useful tool for research and production applications. The video covers the HR AFM, a microscope that is designed for 2D material measurements. The presenter explains the features of the microscope and how it can be used for research and industry.

• 00:00:00 The Atomic Force Microscope (AFM) is an instrument that can be used to measure the height of 2D materials down to the atomic scale and is relatively low cost to purchase and maintain. Paul West will explain some of the insights into using an AFM for imaging graphene and other 2D materials. Today's agenda is to do some AFM Theory, discuss sample preparation, and show a demonstration of how an AFM works.
• 00:05:00 Atomic Force Microscopy (AFM) is a technology used to study 2D materials. The AFM has a very sharp probe, and it's important to make sure the environment is quiet when using the AFM. The success of using AFM for graphene and 2D materials depends on understanding four simple concepts: finding a good site, sampling preparation, controlling the instrument, and image processing.
• 00:10:00 The atomic force microscope is a powerful microscope that can resolve very small features on samples. The noise floor comes in when you look down, and surfaces with a high roughness can cause the height of features to be obscured. Sample preparation is important in order to avoid this noise, and understanding how to use the microscope is essential in order to properly measure step heights. Finally, graphene is a good example of a material that can be measured very accurately with an atomic force microscope.
• 00:15:00 The AFM is a device that can be used to create images of very small objects. To get accurate measurements, the AFM must be calibrated using test patterns that are made from a known, linear material. The x- and y-axes of the AFM are determinate, meaning that the position of the probe at any given time can be accurately predicted. However, the z-axis is not as determinate, and can be affected by noise generated by external sensors.
• 00:20:00 Atomic force microscopy (AFM) is a technique that allows scientists to measure small details on objects. This video demonstrates how to use AFM to calibrate the instrument and then to measure the height of a sample.
• 00:25:00 This video covers the HR AFM, a microscope that is designed for 2D material measurements. The presenter explains the features of the microscope and how it can be used for research and industry.
• 00:30:00 This 1-hour workshop introduces atomic force microscopy (AFM) and discusses its applications in characterizing 2D materials. AFM can be used to measure lateral flake size and height to infer layer count, and to eliminate bias in sample preparation.
• 00:35:00 Atomic force microscopy can be used to measure very small defects in materials. The resonance frequency is adjusted to correspond to the tapping force, which gives the instrument's sensitivity to the vibrating mode.
• 00:40:00 The AFM is a technology that is slow and expensive, and is not commonly used in production because of quality control concerns. However, it can be used in research laboratories for sampling.
• 00:45:00 This video discusses the use of atomic force microscopy (AFM) to examine various materials. AFM can be used to measure small volumes of material at very low forces, making it a useful tool for research and production applications. Questions about AFM equipment can be addressed by contacting the manufacturer. AFM is a versatile tool that can be used to measure a wide range of materials, and is capable of observing complex morphologies.